SN74AUP1G14 - latch-up pri zapnuti napajeni - snad VYRESENO

[Jirka]

Aha, tak asi neni o odolnosti v roli pojistky, kdyby to rekli rovnou v 
nazvu a ne tak debilne kvetnate...

Mimochodem: parametr "latch-up performance" v datasheetu je tedy 
zarucovana velikost spousteciho proudu pro latch-up?


******************************************************************
1 Scope


This specification covers the I-test and the overvoltage latch-up 
testing of integrated circuits.

1.1 Purpose


The purpose of this specification is to establish a method for 
determining IC latch-up characteristics and to define latch-up failure 
criteria. Latch-up characteristics are extremely important in 
determining product reliability and minimizing No Trouble Found (NTF) 
and Electrical Overstress (EOS) failures due to latch-up. This test 
method is applicable to NMOS, CMOS, bipolar, and all variations and 
combinations of these technologies.


1.2 Classification


Two main classes are Class I for latch-up test at room-temperature and 
Class II for latch-up test at the maximum-rated ambient temperature. 
Within Class I and Class II are two levels Level A and Level B in 
Section 1.3.  Level B is for the purpose of defining and reporting a 
higher or lower injection current value as appropriate for the current 
carrying capability of the integrated circuit.


NOTE

Elevated temperature will reduce latch-up resistance, and class II 
testing is recommended for devices that are required to operate at 
elevated temperature.


1.3 Level


Level defines the I-test current injection value used during latch-up 
testing.  Latch-up passing levels are defined as follows:

Level A - The trigger current value in Table 1 shall be +100 mA as 
defined in Figure 5 and -100 mA as defined in Figure 6.  If all pins on 
the part pass at least the Level A trigger current values, then the part 
shall be considered a Level A part.

Level B – If any pins on the part do not pass the level A standard, then 
the supplier shall determine the minimum passing trigger current 
requirement for each pin stressed differently than in Level A.

The maximum (or highest) passing trigger current value shall be reported 
in the record for each pin stressed differently than in Level A, and the 
part shall be considered to be a Level B part.  See 4.2.5.
******************************************************************

--
Jirka


> Jo, tu normu (ktera by mimochodem mela byt bezne verejne dostupna jako
> vsechny zavazne predpisy) jsem na baidu zbezne prochazel uz vcera, ale
> nenasel jsem tam nic inspirujicicho.
>
> A uz vubec ne pro muj pripad.
>
> Mam dojem, ze cela ta norma je spis o odolnosti soucastky, kdyz uz
> latchup vznikne. Proste ze ta soucastka v nove vznikle pozici pojistky
> pripojene paralelne k napajeni toho snese dostatecne hodne...
>
> Ale pripadne me opravte.
>
> --
> Jirka
>
>> http://wenku.baidu.com/view/8f3e2b481ed9ad51f01df232.html
>>
>> Takto se standarne testuji soucastky na latch-up. Pokud by teda nekdo chtel
>> vinit vyrobce, ze jim to faliruje :)
>>
>>
>> PK
>>
>> Dne 13. února 2015 17:01 Jan Waclawek <konfera na efton.sk> napsal(a):
>>
>>> Ani nie tak z ineho zdroja ako od ineho vyrobcu, ak by ste teda mali
>>> zachvat altruizmu... :-)
>>>
>>> wek
>>>
>>>
>>> ----- Original Message ---------------
>>> >Nene, u Farnellu, vzdyt to pisu hned na zacatku
>>> >http://list.hw.cz/pipermail/hw-list/2015-February/471398.html .
>>> >
>>> >Jo a opravuju se - jsou nikoliv Made in China, ale United States, koukal
>>> >jsem totiz omylem na sousedni sacek s DMC2038LVT...
>>> >
>>> >Ja si nemyslim, ze by ty SN74AUP1G14 byly vadne (jinymi slovy horsi nez
>>> >jine kusy), proste se nejspis takhle blbe v urcite situaci chovaji
>>> >vsechny...
>>> >
>>> >Slo by to mozna overit nakupem z uplne jineho zdroje, ale tak daleko
>>> >moje zvidavost ani altruismus zatim nesahaji ;-)
>>> >
>>> >--
>>> >Jirka
>>> >
>>> >> Aha, a boli aj kupovane z nejakeho cinskeho webshopu?
>>> >>
>>> >> wek
>>> >>
>>> >> ----- Original Message ---------------
>>> >>>Jo, je.
>>> >>>
>>> >>>Jeste dodavam, ze tech SN74AUP1G14 jsem v zapojeni vyzkousel celkem 3
>>> >>>kusy, abych vyloucil vadny kus jako pricinu. Chovaly se vsechny
>>> stejne...
>>> >>>
>>> >>>Byly to sousedni kusy z jednoho pasku, takze jedina vada cele serie.
>>> >>>Made in China, ale co dnes neni...